9:15 -9:25: Opening Remarks, Prof. Feng Donglai, ShanghaiTech University
9:25 -10:10: Session One, Prof. Daryl Williams, Surface Measurement Systems
10:10 -10:30: Coffee Break
10:30 -11:15: Session Two, Prof. Haiming Liu, ShanghaiTech University
11:15 -12:00: Session Three, Guest Speaker
12:00 -13:30: Lunch
13:30 -14:15: Session Four, Prof. Yuebiao Zhang, ShanghaiTech University
14:15 -15:00: Session Five, Meishan Guo, Surface Measurement Systems
15:00 -15:20: Coffee Break
15:20 -16:00: On-site Instrument Demonstration